商品介绍

PSI 600LS Manual 300mm WAT Probe Station

PSI 600LS Manual 300mm Wafer Probe Station 适用12 寸之晶圆WAT 应用,具有低漏电流(fA)及高精密度( 0.1μm)。量测搭配精密马达驱动X-Y Stage解析度为 0.1um。可搭配温度控制、或特殊Wager Chuck。显微镜使用精密光学显微镜,同时具有延长显微镜寿命设计。

 

PSI S500 SEMI-AUTOMATIC PROBE STATION

PSI S500 SEMI-AUTOMATIC PROBE STATION 操作容易的半自动探针台,可同时放置10组以上探针座进行量测使用Pendant (keypad)或Joystick操作,可透过RS232介面传输指令。采用固定量测平面设计,显微镜在水平X与Y轴方向各可移动2”。 显微镜使用USMCO精密光学显微镜。可配合National Instruments的Labview™软体或Alliance Technology的Metrics ICS™进行量测。

 

PSI 400/ 410 Quick Position Manual Probe Station

PSI 400/ 410 Quick Position Manual Wafer Probe Station 量测6”~8”晶圆,高精确度,推拉式容易操作,可使用单手操作定位。PSI 400平台Z轴具有3个定位点, PSI 410 显微镜Z轴具有12个定位点。

 

PSI 404LS / 414LS

PSI 404LS / 414LS 4” x 4” X-Y Focus Precision Lead Screw Probe Station 量测6”~8”晶圆,高精确度采用固定量测平面设计,显微镜在水平X与Y轴方向各可移动4”,晶圆承载平台位置可移动6”~8”,可用双手同时调整,容易精确定位。PSI 404平台Z轴具有3个定位点, PSI 414 显微镜Z轴具有12个定位点。提供范围广泛的各种测试应用且同时提供功能强大, 品质稳定的优势。

 

P2525M MANIPULATORS

PRODUCT NAME: P2525M-VM For probing sub-micron geometries, 0.5” (12.7mm) travel per axis, 200 TPI, standard base for use with PSI 400 and 410 stations, either left or right side of station, features fast Z lift. Vacuum.

 

PSI 400LS / 410LS Precision Lead Screw Positioning

PSI 400LS / 410LS Precision Lead Screw Positioning Probe Station 量测6”~8”晶圆,高精确度,推拉式容易操作,可使用单手操作定位。PSI 400LS平台Z轴具有3个定位点, PSI 410 LS显微镜Z轴具有12个定位点。

 

PSI 2020HV™ 电路板讯号完整性测试探针台

PSI 2020HV™ HORIZONTAL/VIRTICAL SIGNAL INTEGRITY TDR PROBE STATION MULTIPLE CIRCUIT BOARD CONFIGURATIONS 适用高速印刷电路板进行电性量测或时域测试(Time Domain Testing)。量测平台可调整为水平或垂直位置,可搭配两具摄影机。显微镜放大倍率为2.1X to 270X。 PSI 2020HV可与Tektronix 11800、SDZOTDR、TDS 8000、80E04TD及Agilent 54750 or 83480相容。如需其他规格请联络本公司

 

BGA PCB 探针台

PSI 1120™ BGA COMPACT GENERAL PURPOSE PROBE STATION 运用於适用BGA、平面显示器(flat panel displays)或高密度印刷电路板(high density populated PCB)电性或信号完整性(Signal Integrity) 量测,适用於各种高速资料传输电路设计测试应用。

Probe tips探针

Straight Tips
Cat whisker Tips
Bend Tips
Double bend Tips
Spring probe Tips
RF/Microwave Tips
Tungsten Tip sizes between 0.1um to 10um.
Plated Gold or special metals Special materials (beryllium cooper, nickel, etc.) available.

Probe Holders

These general-purpose probe holders offer three versions with two different holder tube configurations.

Bent tube at 45 degree angle with either a 45 degree probe tip exit secured by a setscrew or probe tip exit at end (on axis) secured by a set screw on the side.

The third is a straight tube with a probe tip exit at end (on axis) secured with a setscrew on the side.

Specification:
· Tube and tip assembly, 300 series stainless steel
· 22ga. silver plated stranded copper wire with black PTFE insulation
· Standard tested assembly resistance > 0.2 ohms @ 70 degree F
 · Temperature range of probing to 400 degree C · BNC connector, 2 lug male, 50 ohm
 · Accepts Model 7 replaceable probe tips, see probe guide for more information

 

Manipulators探针座

PRODUCT NAME: P210/360VM, LEFT HAND For probing 10 micron geometries, 0.4” (10.0mm) maximum travel per axis, 32 TPI lead screw, mini-arc manipulator, standard vacuum base for use with PSI 400 and 410 stations. If you can not find what you need, Please contact us for more information.

 

P45探针座

PRODUCT NAME: P45, LEFT HAND Left Hand Articulating Arm, 24 TPI (threads per inch), for probing non linear axis 5-10 micron geometries vacuum base